Boron nitride single layer belongs to the family of 2D materials whose optical properties are currently receiving considerable attention. Strong excitonic effects have already been observed in the bulk and still stronger effects are predicted for single layers. We present here a detailed study of these properties by combining ab initio calculations and a tight-binding-Wannier analysis in both real and reciprocal space. Due to the simplicity of the band structure with single valence (π) and conduction (π * ) bands the tight-binding analysis becomes quasi quantitative with only two adjustable parameters and provides tools for a detailed analysis of the exciton properties. Strong deviations from the usual hydrogenic model are evidenced. The ground state exciton is not a genuine Frenkel exciton, but a very localized "tightly-bound" one. The other ones are similar to those found in transition metal dichalcogenides and, although more localized, can be described within a Wannier-Mott scheme.
Hexagonal boron nitride (hBN) has been attracting great attention because of its strong excitonic effects. Taking into account few-layer systems, we investigate theoretically the effects of the number of layers on quasiparticle energies, absorption spectra, and excitonic states, placing particular focus on the Davydov splitting of the lowest bound excitons. We describe how the inter-layer interaction as well as the variation in electronic screening as a function of layer number N affects the electronic and optical properties. Using both ab initio simulations and a tight-binding model for an effective Hamiltonian describing the excitons, we characterize in detail the symmetry of the excitonic wavefunctions and the selection rules for their coupling to incoming light. We show that for N > 2, one can distinguish between surface excitons that are mostly localized on the outer layers and inner excitons, leading to an asymmetry in the energy separation between split excitonic states. In particular, the bound surface excitons lie lower in energy than their inner counterparts. Additionally, this enables us to show how the layer thickness affects the shape of the absorption spectrum.
We compute and discuss the electronic band structure and excitonic dispersion of hexagonal boron nitride (hBN) in the single layer configuration and in three bulk polymorphs (usual AA' stacking, Bernal AB, and rhombohedral ABC). We focus on the changes in the electronic band structure and the exciton dispersion induced by the atomic configuration and the electron-hole interaction. Calculations are carried out on the level of ab initio many-body perturbation theory (GW and Bethe Salpeter equation) and by means of an appropriate tight-binding model. We confirm the change from direct to indirect electronic gap when going from single layer to bulk systems and we give a detailed account of its origin by comparing the effect of different stacking sequences. We emphasize that the inclusion of the electron-hole interaction is crucial for the correct description of the momentum-dependent dispersion of the excitations. It flattens the exciton dispersion with respect to the one obtained from the dispersion of excitations in the independent-particle picture. In the AB stacking this effect is particularly important as the lowest-lying exciton is predicted to be direct despite the indirect electronic band gap. arXiv:1806.06201v2 [cond-mat.mtrl-sci]
Photoluminescence characterization of semiconductors is a powerful tool for studying shallow and deep defects. Excitation-intensity-dependent measurements at low temperatures are typically analyzed to distinguish between exciton and defect related transitions. We have extended existing models based on rate equations to include the contribution of deep defects. Generally, it is observed that the photoluminescence intensity IPL follows a power law IPL∝ϕk with the excitation intensity ϕ. We show that the exponent k takes on values of multiples of 1/2. The values depend on the availability of additional recombination channels. Defect levels can saturate at high enough excitation intensities, leading to one or several crossover points from one power law behavior to another. Power law exponents different from n/2 can result from the transition region between two limiting cases of linear power laws. Model functions for the analytical description of these transitional excitation dependencies are derived and the analysis is applied to chalcopyrite thin films and to numerical data. The saturation effects of defects by excess carriers as well as the influence of deep recombination centers can be extracted with the help of the presented model, which extends existing theories.
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