No abstract

Semiconductor technology scaling faced tough engineering challenges while moving towards and beyond the deep sub-micron range. One of the most demanding issues, limiting the shrinkage process until the present day, is the difficulty to control the leakage currents in nanometer-scaled field-effect transistors. Previous articles have shown that this source of energy dissipation, at least in case of digital CMOS logic, can successfully be exploited as a side-channel to recover the secrets of cryptographic implementations. In this work, we present the first fair technology comparison with respect to static power side-channel measurements on real silicon and demonstrate that the effect of down-scaling on the potency of this security threat is huge. To this end, we designed two ASICs in sub-100nm CMOS nodes (90 nm, 65 nm) and got them fabricated by one of the leading foundries. Our experiments, which we performed at different operating conditions, show consistently that the ASIC technology with the smaller minimum feature size (65 nm) indeed exhibits substantially more informative leakages (factor of ~10) than the 90nm one, even though all targeted instances have been derived from identical RTL code. However, the contribution of this work extends well beyond a mere technology comparison. With respect to the real-world impact of static power attacks, we present the first realistic scenarios that allow to perform a static power side-channel analysis (including noise reduction) without requiring control over the clock signal of the target. Furthermore, as a follow-up to some proof-of-concept work indicating the vulnerability of masking schemes to static powerattacks, we perform a detailed study on how the reduction of the noise level in static leakage measurements affects the security provided by masked implementations. As a result of this study, we do not only find out that the threat for masking schemes is indeed real, but also that common leakage assessment techniques, such as the Welch’s t-test, together with essentially any moment-based analysis of the leakage traces, is simply not sufficient in low-noise contexts. In fact, we are able to show that either a conversion (resp. compression) of the leakage order or the recently proposed X2 test need to be considered in assessment and attack to avoid false negatives.

No abstract

Hardware Trojans have drawn the attention of academia, industry and government agencies. Effective detection mechanisms and countermeasures against such malicious designs can only be developed when there is a deep understanding of how hardware Trojans can be built in practice, in particular Trojans specifically designed to avoid detection. In this work, we present a mechanism to introduce an extremely stealthy hardware Trojan into cryptographic primitives equipped with provably-secure first-order side-channel countermeasures. Once the Trojan is triggered, the malicious design exhibits exploitable side-channel leakage, leading to successful key recovery attacks. Generally, such a Trojan requires neither addition nor removal of any logic which makes it extremely hard to detect. On ASICs, it can be inserted by subtle manipulations at the sub-transistor level and on FPGAs by changing the routing of particular signals, leading to zero logic overhead. The underlying concept is based on modifying a securely-masked hardware implementation in such a way that running the device at a particular clock frequency violates one of its essential properties, leading to exploitable leakage. We apply our technique to a Threshold Implementation of the PRESENT block cipher realized in two different CMOS technologies, and show that triggering the Trojan makes the ASIC prototypes vulnerable.

Vulnerability of cryptographic devices to side-channel analysis attacks, and in particular power analysis attacks has been extensively studied in the recent years. Among them, static power analysis attacks have become relevant with moving towards smaller technology nodes for which the static power is comparable to the dynamic power of a chip, or even dominant in future technology generations. The magnitude of the static power of a chip depends on the physical characteristics of transistors (e.g., the dimensions) as well as operating conditions (e.g., the temperature) and the electrical specifications such as the threshold voltage. In fact, the electrical specifications of transistors deviate from their originally intended ones during device lifetime due to aging mechanisms. Although device aging has been extensively investigated from reliability point of view, the impact of aging on the security of devices, and in particular on the vulnerability of devices to power analysis attacks are yet to be considered.This paper fills the gap and investigates how device aging can affect the susceptibility of a chip exposed to static power analysis attacks. To this end, we conduct both, simulation and practical experiments on real silicon. The experimental results are extracted from a realization of the PRESENT cipher fabricated using a 65nm commercial standard cell library. The results show that the amount of exploitable leakage through the static power consumption as a side channel is reduced when the device is aged. This can be considered as a positive development which can (even slightly) harden such static power analysis attacks. Additionally, this result is of great interest to static power side-channel adversaries since state-of-the-art leakage current measurements are conducted over long time periods under increased working temperatures and supply voltages to amplify the exploitable information, which certainly fuels aging-related device degradation.