In this study, tri-rutile type Mg 0.5 Ti 0.5 TaO 4 ceramics were synthesized, where the structureproperty relationship, especially the structural configuration and intrinsic dielectric origin of Mg 0.5 Ti 0.5 TaO 4 ceramics, and the low-firing characteristics were studied. It is found that the tri-rutile structural type is unambiguously identified through the Rietveld refinement analysis, the selected area electron diffraction (SAED), and the high-resolution transmission electron microscopy (HRTEM) along the [110] zone axis. With the increase in sintering temperature, the densification and uniformity of crystal growth play important roles in regulating the microwave dielectric properties of Mg 0.5 Ti 0.5 TaO 4 ceramics. Intrinsically, theoretical dielectric properties calculated by the far-infrared reflective spectra approached the experimental values, indicating the importance of structural features to dielectric properties. Furthermore, a glass additive with high matching relevance with ceramics has been developed to decrease the high sintering temperature of Mg 0.5 Ti 0.5 TaO 4 ceramics, where 2-4 wt% Li 2 O-MgO-ZnO-B 2 O 3 -SiO 2 (LMZBS) glass frit was adopted to reduce the suitable temperature from 1275 to 1050 ℃ without significantly deteriorating the microwave dielectric characteristics. Specifically, Mg 0.5 Ti 0.5 TaO 4 ceramics containing 2 wt% glass addition sintered at 1050 ℃ for 4 h possess excellent microwave dielectric properties: dielectric constant (ε r ) = 44.

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