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This study presented the effects of carrier-transporting layer (CTL) on electroluminescence (EL) performance of a blue phosphorescent organic light-emitting diodes (PHOLEDs) with electron transporting host based on three kinds of electron-transporting layers (ETLs) including 3-(4-biphenyl-yl)-4-phenyl-5-(4-tert-butylphenyl)-1,2,4-triazole (TAZ), diphenyl-bis[4-(pyridin-3-yl)phenyl]silane (DPPS) and 1,3,5-tri(m-pyrid-3-yl-phenyl)benzene (TmPyPB) and two kinds of hole-transporting layers (HTLs) such as 4,4′-bis[N-1-naphthyl-N-phenyl-amino]biphenyl (NPB), 1,1-bis[(di-4-tolylamino)phenyl]cyclohexane (TAPC). The carrier recombination and exciton formation zones in blue PHOLEDs strongly depend on the carrier mobility of CTLs and the layer thickness, especially the carrier mobility. Between ETLs and HTLs, the high electron mobility of ETL results in a lower driving voltage in blue PHOLEDs than the high hole mobility of HTL did. In addition, layer thickness modulation is an effective approach to precisely control carriers and restrict carriers within the EML and avoid a leakage emission of CTL. For CTL pairs in OLEDs using the electron transporting host system, ETLs with low mobility and also HTLs with high hole mobility are key points to confine the charge in EML for efficient photon emission. These findings show that appropriate CTL pairs and good layer thickness are essential for efficient OLEDs.

In this work, we demonstrated the electron-transporting layer (ETL) effects on device electroluminescence (EL) performance of blue phosphorescent organic light-emitting diodes (PhOLED). Three well known electron-transporting materials such as 3-(4-biphenyl-yl)-4-phenyl-5-(4-tert-butylphenyl)-1,2,4-triazole (TAZ), diphenyl-bis[4-(pyridin-3-yl)phenyl]silane (DPPS) and 1,3,5-tri( m-pyrid-3-yl-phenyl)benzene (TmPyPB) were employed as ETL inside a blue PhOLED. The material properties of these three ETL materials individually dominated the different location of carrier recombination and exciton formation inside device, especially carrier mobility. By investigating the EL performance of these three devices, one can be concluded that high carrier mobility ETL results to a low driving voltage, worse carrier confinement in the emitting layer, greater amount of leakage electrons. The great efficiency performance is dominated by the great carrier confinement in the emitting layer.