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The presented work is embedded in the research network "Integrative Ion Processes for Modern Optics", called IntIon, consisting of 12 partners from the German optics industry and two research institutes. The main target of the IntIon network is the development of new process concepts on the basis of ion assisted deposition (IAD) for the industrial production of optical thin film components. Besides an improvement in efficiency, a major aim is concentrated on the optical characteristics for selected application fields with high economical potential. In this network, different ion and plasma sources are compared with regard to their qualification for ion assisted deposition processes. This work includes the characterization of the ion energy and ion current using Faraday-cup measurements. The selection of investigated coating materials includes a broad variety of standard and non-standard oxides. First results of the network will be presented for adapted deposition materials and different operation characteristics of ion sources.

A gain-flattening filter (GFF) for minimum manufacturing errors (12 designs submitted) and dense wavelength-division multiplex (DWDM) filters for low group-delay (GD) variation (9 designs submitted) was the subject of a design contest held in conjunction with the Optical Interference Coatings 2001 topical meeting of the Optical Society of America. Results of the contest are given and evaluated. It turned out that the parameter space for GFFs with optimum performance when manufacturing errors are not considered is much different from that when manufacturing errors are considered. DWDM filter solutions with low GD variation are possible.

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Waveguide Technology is widely believed to constitute one of the most promising approaches to realize affordable Augmented Reality (AR) / Mixed Reality (MR) devices combining smallest form-factor with uncompromised image quality allowing for full immersion user experience. Optical waveguides are made from special grade glass wafers. The characteristics of such wafers are directly determining image properties, such as Field-of-View, contrast, brightness, distortion of the image projected into the user's eye and many more. We are reporting latest advances in measuring and controlling key quality parameters with focus on total thickness variation, optical homogeneity and thickness tolerance of the wafers. We discuss the impact of these parameters on image quality using optical modelling of the waveguides. Light-guide modeling -influence of waferproperties Light-guide modeling by fast physical optics is used to find the correlation of device properties with parameters of glass wafers. This basic understanding is necessary to spot requests and resulting