We show that a near-field scanning thermal microscope, which essentially detects the local density of states of the thermally excited electromagnetic modes at nanometer distances from some material, can be employed for nanoscale imaging of structures on that material's surface. This finding is explained theoretically by an approach which treats the surface structure perturbatively

We report on the design, characterization, and performance of a near-field scanning thermal microscope capable to detect thermal heat currents mediated by evanescent thermal electromagnetic fields close to the surface of a sample. The instrument operates in ultrahigh vacuum and retains its scanning tunneling microscope functionality, so that its miniature, micropipette-based thermocouple sensor can be positioned with high accuracy. Heat currents on the order of 10(-7) W are registered in z spectroscopy at distances from the sample ranging from 1 to about 30 nm. In addition, the device provides detailed thermographic images of a sample's surface.