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Abstract-Magnetic field and temperature dependencies of the critical current density, ( ) were measured by SQUIDmagnetometry, ac magnetic susceptibility, and dc transport current techniques in the single-crystalline epitaxially-grown by offaxis dc magnetron sputtering YBa 2 Cu 3 O 7 (YBCO) films with ( 77 K) 2 10 6 A/cm 2 . The mechanism of vortex depinning from growth-induced linear defects, i.e., out-of-plane edge dislocations in low-angle tilt domain boundaries, is shown to describe quantitatively measured (). The developed model takes into account a statistical distribution of the dislocation domain boundaries ordered in a network as well as the interdislocation spacing within boundaries. Actual structural features of YBCO film known from HREM data turn out to be extracted from ( )-curves by a fitting procedure within the proposed model.

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