The authors present a comprehensive test procedure for digital devices, based on the calculation and control of two or more characteristics of a binary signal at a control point. The procedure is aimed at how to increase the reliability of performance monitoring and localization of the failure of digital devices as part of automated versatile systems.

The paper discusses the methods of optimizing the troubleshooting parameters, based on a combination of heuristic algorithms with the linear integer programming method. The methods are aimed at minimizing costs when creating troubleshooting support for healthy condition monitoring and troubleshooting for in-service and recoverable electronic devices and equipment of electric power systems.