Noise on scanning electron microscope (SEM) images is studied. Gaussian noise is the most common type of noise in SEM image. We developed a new noise reduction filter based on the Wiener filter. We compared the performance of this new filter namely adaptive noise Wiener (ANW) filter, with four common existing filters as well as average filter, median filter, Gaussian smoothing filter and the Wiener filter. Based on the experiments results the proposed new filter has better performance on different noise variance comparing to the other existing noise removal filters in the experiments.
A new technique based on nearest neighbourhood method is proposed. In this paper, considering the noise as Gaussian additive white noise, new technique single-image-based estimator is proposed. The performance of this new technique such as adaptive slope nearest neighbourhood is compared with three of the existing method which are original nearest neighbourhood (simple method), first-order interpolation method and shape-preserving piecewise cubic hermite autoregressive moving average. In a few cases involving images with different brightness and edges, this adaptive slope nearest neighbourhood is found to deliver an optimum solution for signal-to-noise ratio estimation problems. For different values of noise variance, the adaptive slope nearest neighbourhood has highest accuracy and less percentage estimation error. Being more robust with white noise, the new proposed technique estimator has efficiency that is significantly greater than those of the three methods.
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