Charge extraction by linearly increasing voltage (CELIV) is a powerful and widely used technique for studying charge transport physics, particularly in disordered systems such as organic semiconductors. In this article, we show that CELIV photocurrent transients are strongly dependent on experimental conditions, such as the light intensity and absorption profile. With this in mind, we introduce a universal correction factor that qualitatively extends previously derived CELIV equations, allowing carrier mobility to be estimated at various photogenerated carrier concentrations and, most importantly, photogeneration profiles. In addition, we demonstrate how the CELIV technique can be conveniently used to determine precisely the presence of Langevin bimolecular carrier recombination.