e motivation of this investigation is to explore the possibility of using the depth profile capability of XPS to study interfaces after SOFC button cell testing. e literature uses XPS to study various cathode materials but has devoted little to the understanding of various cathode interfaces especially after testing. In this work, an SOFC button cell is first tested, and then, the LSCF cathode, barrier layer, and electrolyte are sputtered away to study the behavior of different interfaces. is work has shown that some elements have moved into other layers of the SOFC cell. It is argued that the migration of the elements is partly due to a redeposition mechanism after atoms are sputtered away, while the rest is due to interdiffusion between the SDC and YSZ layers. However, additional work is needed to better understand the mechanism by which atoms move around at different interfaces. e cell electrochemical performance is also discussed in some details but is not the focus.

This paper reports the study of an anode-supported SOFC cell containing an LSCF-SDC composite cathode. The SOFC cell was tested at different temperatures and reactant flow rates. After testing, the cell was sectioned and characterized using SEM/EDS. Such analysis indicated that no structural damage and no significant interdiffusion of elements among the layers occurred. The measured electrochemical performance data at different temperatures indicate an Arrhenius behavior or temperature activated processes. The low-porosity anode functional layer appears to be very sensitive to low hydrogen contents. The electrochemical performance is also affected by changing air flow rates.