For nanodimensional magnetically inhomogeneous amorphous granular films of the system (Co 84 Nb 14 Ta 2 ) x (SiO 2 ) 100−x , 30 ≤ x ≤ 60 at.% the concentration dependences of the magnetooptical Kerr effect (MOKE) spectra and FMR have been investigated. The observed changes in the MOKE and FMR spectra are associated with transformations of microstructure and topology of the nanocomposites. For the compositions within the percolation region the transversal Kerr effect increases by an order of magnitude.

Magnetic and magneto-optical properties of multilayers based on the (Co45Fe45Zr10)Z(Al2O3)100-Z composite and amorphous hydrogenated silicon with various thicknesses both of magnetic and semiconductor layers have been investigated. The nonlinear dependence of magnetic and MO characteristics of the nanostructures on the thickness of layers was found. The interface formed on the boundary of two phases (the ferromagnetic granules and the semiconductor ones) strongly influences the magnetic and MO properties of the structures with thin Si layers.

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Spectra and field dependencies of Transversal Kerr Effect (TKE) for [(Co45Fe45Zr10)46(Al2O3)54(X)/Si (Y)]nmultilayers (ML) with thin layers (X < 2,5 nm; Y < 3,5 nm) have been studied in the energy range 0,5 – 4,0 eV. It was found that TKE field dependencies in the nearest infrared (IR) and visible energy ranges exhibit anomalous behavior. TKE spectra measured in weak (~30 Oe) and strong (~2 kOe) magnetic fields were essentially different. It was shown that magneto-optical response of multilayered structure composite-silicone is the sum of magnetic composite layers and composites formed on interface contributions. And these contributions may have an opposite sign of TKE. Interface magnetic states depend on composite and semiconductor layers’ thicknesses and FM phase concentration in composite layers.

Spectral and field dependencies of Transversal Kerr Effect (TKE) for [(Co45Fe45Zr10)Z(Al2O3)100-Z(X)/α-Si:H(Y)] n multilayers have been studied in the energy range 0.5 - 4.0 eV. It was found that TKE field dependencies in the nearest IR energy range exhibit anomalous behavior for structures only with thin Si layers and this behavior vanishes with increasing of the Si layer thickness. TKE spectra measured in small and large magnetic fields were essentially different. It was shown that magneto-optical response of multilayered structure composite-silicon is the sum of contributions from two composites: (Co45Fe45Zr10) - Al2O3 + Si + silicides and (Co45Fe45Zr10) - Si + silicides, which have a different sign of TKE in the nearest IR spectrum and their magnetic states depend both on composite and semiconducting layer thicknesses.