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Kinetic roughening during thin film growth is a widely studied phenomenon, with many systems found to follow simple scaling laws. We show that for Cu electrodeposition from additive-free acid sulphate electrolyte, an extra scaling exponent is required to characterize the time evolution of the local roughness. The surface width w(l,t) scales as t(beta(loc))lH, when the deposition time t is large or the size l of the region over which w is measured is small, and as t(beta+beta(loc)) when l is large or t is small. This is the first report of such anomalous scaling for an experimental ( 2+1)-dimensional system. When the deposition current density or Cu concentration is varied, only beta(loc) changes, while the other power law exponents H and beta remain constant.

Co–Ni–Cu/Cu multilayered nanowires were prepared by electrodeposition using nanoporous aluminum oxide membranes rather than the more usual track-etched polycarbonate membranes as templates. Very large values of the current perpendicular to plane giant magnetoresistance (CPP-GMR) were recorded: 55% at room temperature and 115% at 77 K. The use of aluminum oxide membranes also made possible a study of the effects of annealing on the CPP-GMR.

Citation for published item:wil nD h vid gF nd elEyw ediD yd y eF nd yerthelD w rieEghristine nd w rqu¡ esEqonz¡ lezD nti go nd frookeD i h rd tF nd fry eD w rtin F nd ge D il r nd perrerD t ime nd rigginsD imon tF nd v m ertD golin tF nd vowD ul tF nd solt w nriqueD h vid nd w rtinD nti go nd xi holsD i h rd tF nd hw rz herD lther nd q r ¡ % E u¡ rezD ¡ % tor wF @PHITA 9 olvent dependen e of the single mole ule ondu t n e of oligoyneE sed mole ul r wiresF9D tourn l of physi l hemistry gFD IPH @PWAF ppF ISTTTEISTURF Further information on publisher's website:This document is the Accepted Manuscript version of a Published Work that appeared in nal form in The Journal of Physical Chemistry C, copyright c American Chemical Society after peer review and technical editing by the publisher. To access the nal edited and published work see http://dx.doi.org/10.1021/acs.jpcc.5b08877. Additional information:Use policyThe full-text may be used and/or reproduced, and given to third parties in any format or medium, without prior permission or charge, for personal research or study, educational, or not-for-pro t purposes provided that:• a full bibliographic reference is made to the original source • a link is made to the metadata record in DRO • the full-text is not changed in any way The full-text must not be sold in any format or medium without the formal permission of the copyright holders.Please consult the full DRO policy for further details.