Wafer-scale production of single InGaN quantum disks (QD) ina-nanorod array with small rod diameter (> 9 nm) and low rod-density (< 10 8 cm −2 ) has been achieved without extensive processing steps. Excitation power-dependent µPL spectrum of single QD reveals multi-excitonic peak with 0.75 meV blue-shift for 3 orders of magnitude increasing power, indicating the present system is spectrally stable and nearly free of quantum-confined Stark effects, due possibly to the strain relaxation induced by free surface of small rod diameters. The fully polarized emissions, a high working temperature (180 K), low rod density and good alignment, render this system promising as a potential quantum photon source.

The optical properties of single InGaN/GaN heterostructure nanowires (NWs) with a mean diameter down to 18 nm are investigated. Sharp emission lines originating from the recombination of localized excitons in the InGaN disk layer can be resolved. Excitation-dependent energy shifts, together with spectral diffusions of these emission lines, indicate the presence of a weak quantum confined Stark effect (QCSE) caused by nearby charge fluctuations, rather than the screening of piezoelectric polarizations at the InGaN/GaN interface. The absence of a piezoelectric polarization field is further confirmed by time-resolved photoluminescence measurements. Numerical simulations reveal that the elastic strain relaxation via the NW geometry is marginal and occurs only near the NW sidewalls. Carrier localization preferentially near the periphery of the InGaN disk and alloy intermixing are suggested as possible reasons for the absence of a polarization-induced QCSE in thin InGaN/GaN heterostructure NWs.

Structural and optical properties of thick InGaN layers with strain and composition inhomogeneities are investigated. High resolution x-ray diffractions (XRD) and reciprocal space mapping (RSM) along an asymmetric axis reveal that the In composition inhomogeneity is accompanied by strain relaxations during the growth of thick InGaN layers. According to the structural analysis, the commonly observed double photoluminescence (PL) peaks have been confirmed to be associated with the strain relaxation in thick InGaN films. Temperature-dependent PL measurements further indicate that the relaxed phase in InGaN films exhibits better emission efficiency than the strained phase. Recombination dynamics reveal that the carrier localization effect is more pronounced in the relaxed phase due to the compositional pulling effect. The correlations between emission efficiency and localization effect in thick InGaN films are discussed.

Up-converted heterostructures with a Mn-doped GaN intermediate band photodetection layer and an InGaN/GaN multiple quantum well (MQW) luminescence layer grown by metal-organic vapor-phase epitaxy are demonstrated. The up-converters exhibit a significant up-converted photoluminescence (UPL) signal. Power-dependent UPL and spectral responses indicate that the UPL emission is due to photo-carrier injection from the Mn-doped GaN layer into InGaN/GaN MQWs. Photons convert from 2.54 to 2.99 eV via a single-photon absorption process to exhibit a linear up-conversion photon energy of ~450 meV without applying bias voltage. Therefore, the up-conversion process could be interpreted within the uncomplicated energy level model.

The surface morphologies, alloy compositions and emission properties of In-rich In x Ga 1−x N nanodots (x 0.87) grown by metallo-organic chemical vapor deposition at various growth temperatures (550-750 • C) were investigated. We found that the nucleation of InGaN dots was dominated by the surface migration of In adatoms. A higher Ga content can be achieved at lower growth temperatures due to the relatively lower migration ability of Ga adatoms. At higher growth temperatures, the InGaN dots tend to decompose into In-rich islands and a thin Ga-rich layer. These In-rich islands exhibit photoluminescence emission in the near-infrared range. Another visible emission band was also observed for samples grown at higher temperatures.