First-order reversal curve diagrams, or FORC diagrams, have been studied to determine if the widths of their distributions along the interaction and coercivity axes can be related to the mean-field magnetization dependent interaction field (MDIF). Arrays of nanowires with diameters ranging from 18 up to 100 nm and packing fractions varying from 0.4 to 12% have been analyzed. The mean-field MDIF has been measured using the remanence curves and used as a measuring scale on the FORC diagrams. Based on these measurements, the full width of the interaction field distribution and the full width at half maximum (FWHM) of the FORC distribution profile along the interaction field direction are shown to be proportional to the MDIF, and the relation between them is found. Moreover, by interpreting the full width of the coercive field distribution in terms of the dipolar induced shearing, a simple relation is found between the width of this distribution and the MDIF. Furthermore, we show that the width of the FORC distribution along the coercive field axis is equal to the width of the switching field distribution obtained by the derivation of the DC remanence curve. This was further verified with the switching field distribution determined using in-field magnetic force microscopy (MFM) for very low density nanowires. The results are further supported by the good agreement found between the experiments and the values calculated using the mean-field model, which provides analytical expressions for both FORC distributions.