The wide-field (2.42 mm × 1.36 mm, resolution: 5.04 µm) tomography imaging of double circuits is performed using nitrogen-vacancy (NV) center ensembles in a diamond. The magnetic-field distribution on the surface of the circuit produced by the lower layer is obtained. Vector magnetic superposition is used to separate the magnetic-field distribution produced by the lower layer from the magnetic-field distribution produced by two layers. An inversion model is used to perform the tomography imaging of the magnetic-field distribution on the lower layer surface. Compared with the measurements of the upper layer, the difference in the maximum magnetic-field intensity of inversion is approximately 0.4%, and the difference in the magnetic-field distribution of inversion is approximately 8%, where the depth of the lower layer is 0.32 mm. Simulations are conducted to prove the reliability of the imaging. These results provide a simple and highly accurate reference for the detection and fault diagnosis of multilayer and integrated circuits.

Radiation with high-efficiency, large-bandwidth, and uniform magnetic field radiation antennas in a large field of view are the key to achieving high-precision wide-field imaging. This paper presents a hollow Ω-type antenna design for diamond nitrogen-vacancy (NV) ensemble color center imaging. The uniformity of the antenna reaches 94% in a 4.4 × 4.4 mm2 area. Compared with a straight copper antenna, the radiation efficiency of the proposed antenna is 71.8% higher, and the bandwidth is improved by 11.82 times, demonstrating the effectiveness of the hollow Ω-type antenna.

.Microwave chips dependent devices constitute the cornerstone of many classical and emerging quantum technologies. To meet the demand for high-resolution, lossless, and fast wide-field imaging of microwave devices, we propose a wide-field microwave imaging method based on diamond nitrogen-vacancy center ensembles by combining continuous wave optically detected magnetic resonance technology with optical wide-field imaging technology. First, the optimal selection of laser parameters is achieved by measuring different laser powers. Then the accuracy of the wide-field microwave imaging technique is demonstrated by measuring the near-field imaging of the antenna surface at different microwave input powers and different microwave input frequencies. The spatial resolution of the imaging system is 5  μm over a field of view of 2400  μm  ×  1350  μm, and the optimal microwave precision measurement sensitivity is 5.6  μT  /  Hz1/2. The above results are expected to provide a practical reference for applications such as fault diagnosis of highly integrated microwave circuits, antenna radiation profiling, and electro magnetic compatibility testing of integrated microwave circuits.