After the production of printed circuit boards (PCB), PCB manufacturers need to remove defected boards by conducting rigorous testing, while manual inspection is time-consuming and laborious. Many PCB factories employ automatic optical inspection (AOI), but this pixel-based comparison method has a high false alarm rate, thus requiring intensive human inspection to determine whether alarms raised from it resemble true or pseudo defects. In this paper, we propose a new cost-sensitive deep learning model: cost-sensitive siamese network (CSS-Net) based on siamese network, transfer learning and threshold moving methods to distinguish between true and pseudo PCB defects as a cost-sensitive classification problem. We use optimization algorithms such as NSGA-II to determine the optimal cost-sensitive threshold. Results show that our model improves true defects prediction accuracy to 97.60%, and it maintains relatively high pseudo defect prediction accuracy, 61.24% in real-production scenario. Furthermore, our model also outperforms its state-of-the-art competitor models in other comprehensive cost-sensitive metrics, with an average of 33.32% shorter training time.
Extreme Learning Machine (ELM) is characterized by simplicity, generalization ability, and computational efficiency. However, previous ELMs fail to consider the inherent high-order relationship among data points, resulting in being powerless on structured data and poor robustness on noise data. This paper presents a novel semi-supervised ELM, termed Hypergraph Convolutional ELM (HGCELM), based on using hypergraph convolution to extend ELM into the non-Euclidean domain. The method inherits all the advantages from ELM, and consists of a random hypergraph convolutional layer followed by a hypergraph convolutional regression layer, enabling it to model complex intraclass variations. We show that the traditional ELM is a special case of the HGCELM model in the regular Euclidean domain. Extensive experimental results show that HGCELM remarkably outperforms eight competitive methods on 26 classification benchmarks.
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