There is a growing trend to apply field emission (FE) electron sources in vacuum electronic devices due to their fast response, high efficiency and low energy consumption compared to thermionic emission ones. Carbon nanotubes (CNTs) have been regarded as a promising class of electron field emitters since the 1990s and have promoted the development of FE technology greatly because of their high electrical and thermal conductivity, chemical stability, high aspect ratio and small size. Recent studies have shown that FE from CNTs has the potential to replace conventional thermionic emission in many areas and that it exhibits advanced features in practical applications. Consequently, FE from nanotubes and applications thereof have attracted much attention. This paper provides a comprehensive review of both recent advances in CNT field emitters and issues related to applications of CNT based FE. FE theories and principles are introduced, and the early development of field emitters is related. CNT emitter types and their FE performance are discussed. The current situation for applications based on nanotube FE is reviewed. Although challenges remain, the tremendous progress made in CNT FE over the past ten years indicates the field's development potential.

Field emission (FE) uniformity and the mechanism of emitter failure of freestanding carbon nanotube (CNT) arrays have not been well studied due to the difficulty of observing and quantifying FE performance of each emitter in CNT arrays. Herein a field emission microscopy (FEM) method based on poly(methyl methacrylate) (PMMA) thin film is proposed to study the FE uniformity and CNT emitter failure of freestanding CNT arrays. FE uniformity of freestanding CNT arrays and different levels of FE current contributions from each emitter in the arrays are recorded and visualized. FEM patterns on the PMMA thin film contain the details of the CNT emitter tip shape and whether multiple CNT emitters occur at an emission site. Observation of real-time FE performance and the CNT emitter failure process in freestanding CNT arrays are successfully achieved using a microscopic camera. High emission currents through CNT emitters causes Joule heating and light emission followed by an explosion of the CNTs. The proposed approach is capable of resolving the major challenge of building the relationship between FE performance and CNT morphologies, which can significantly facilitate the study of FE non-uniformity, the emitter failure mechanism and the development of stable and reliable FE devices in practical applications.

A low density vertically aligned carbon nanotube-based field-emission cathode with a ballast resistor and coaxial gate is designed and fabricated. The ballast resistor can overcome the non-uniformity of the local field-enhancement factor at the emitter apex. The self-aligned fabrication process of the coaxial gate can avoid the effects of emitter tip misalignment and height non-uniformity.