In this article, a new method that is based on a combination of electromagnetic topology and mode matching is proposed for the analysis of electromagnetic field coupling. The proposed method can accurately solve the electromagnetic field coupling in a complex system with a short computation time and reduced memory. A wire within an aperture-backed cavity model was analyzed, and the electric field intensity in the cavity and the induced surface current on the wire were computed. The results were compared with finite difference time domain results and confirmed the electromagnetic field coupling is influenced by the geometry of the enclosure.

No abstract

In this paper, a new method, based on the combination of Electromagnetic Topology (EMT) and ModeMatching (MM), is proposed for the analysis of the electromagnetic field coupling phenomena from an external field to an inner electric system. The proposed method can solve the electromagnetic field coupling in a complex system accurately and requires a short computation time and reduced memory. To verify the validity of this method, an aperture backed cavity model was analyzed and the electric field intensity in the cavity and the induced surface current on the wire were computed. The results were compared with FDTD results.

In this paper we suggest a special measurement system using an optical transformation when an analog switch chip is exposed by an external High Power Microwave(HPM). The proposed measurement system can compare a normal operation with a malfunction of the chip, analyzed signals at each pin of the chip when the HPM radiates to the chip. To analyze accurately the operation of the chip proposed measurement system uses an optical communication method. An electrical signal of the chip is modulated to an optical signal by a laser diode(LD) within the range of the HPM. After that, the modulated optical signal is demodulated to the electrical signal by a photo diode(PD) beyond the range of the HPM and then signal is measured. Because this system has no interference between frequency of microwaves and optical waves, an accurate analysis is possible.978-1-4244-6307-7/10/$26.00 ©2010 IEEE

-In this paper, electromagnetic topology (EMT) was used to analyze the electromagnetic compatibility (EMC) of RF circuits including passive and active components. It is difficult to obtain usable results for problems relating to electromagnetic coupling in complex systems when using conventional numerical or experimental methods. Thus it is necessary to find a new methodology for analyzing EMC problems in complicated electromagnetic environments. In order to consider the nonlinear characteristics of active components, a SPICE diode model was used. A power detector circuit and the receiver circuit of a radio control (RC) car were analyzed and experimented in order to verify the validity of this method.