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The low volume fraction of carbide phase in carbon steel determines that it is difficult to estimate the stress state in it by diffraction method. In the present study, different from the studies before, we improve the technique of surface treatment on specimen and have successfully finished the stress estimations of carbide phase in carbon steels by X-ray diffraction method under normal conditions. Moreover, we investigate the affection of spherical cementite particle size on the residual stress distribution in both phases during the plastic deformed steels. We observed that the steels with small-sized cementite particles showed higher stress states than the steels with relatively large-sized cementite particles.

This article deals with the characterization of the mechanical behaviors of spheroidized carbon steels, which contain ferrite and spheroidal cementite. The aim of the study is to identify the deformation behaviors of cementite particles by x-ray diffraction and to correlate them to the residual stress state evolution. The stress state evolutions for both phases during an in situ 4-point bending test and after a uniaxial tensile test that have been well followed by x-ray diffraction. After each tensile loading, optical observation is made to correlate the determined residual stress state with the microstructure. The coupling of techniques helps us to characterize the deformation evolution of spheroidal cementite in the carbon steel: at the initial state, the cementite shows the same elastic behavior as the ferrite; at the next state, the ferrite begins to deform plastically but the cementite deforms elastically; then, plastic relaxation occurs in the ferrite while the cementite still deforms elastically until finally breaking.

Abstract. The purpose of this study is to examine the effect of crystallite preferred orientation on the mechanical strength of TiCN thin films in highly compressive residual stress. TiCN thin films were deposited by PVD on JIS-SKH55 (AISI M35) steel. The applied substrate bias voltages were set for -50, -80, -100, -120 and -150V. Subsequently, residual stress and crystalline preferred orientation of these specimens were investigated by X-ray diffraction methodology. The crystalline preferred orientation in thin films was evaluated by the ODF calculated from pole figures. On the other hand, dynamic hardness test (DH) and scratch test were executed to evaluate the mechanical strength of thin films. In our study, it was observed that negative bias voltages had an effect on the preferred orientation. The orientation density at -120V was the highest of all specimens. In addition, the value of scratch section area at -120V was the largest of all specimens. As a conclusion, the relation between the scratch area and the negative bias voltages corresponded to the relation between the preferred orientation and the bias voltages.

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