Degradation of a REBCO coil under external magnetic fields is one of the major technical problems in the field of HTS magnet technology. A possible cause of such degradation is an inhomogeneous hoop stress distribution, or hoop stress modification (both increase and decrease), induced by the screening current.In this work, we investigate such a hoop stress modification by a small coil experiment with a strain measurement and a numerical simulation. An experimental result shows a very high stress increase factor of >4.1, defined by the maximum circumferential stress over B z JR stress, and the simulated result is in qualitative agreements. The strain (stress) shows a hysteresis effect corresponding to the screening current behavior. A large hoop stress modification causes not only a hoop stress increase, but also buckling of the conductor, which induces delamination and micro-clacks of the superconducting layer. We also show the stress modification can be reduced by bonding turns with epoxy.

The characteristic magnetic field delay time for a no-insulation (NI) REBCO layer-wound coil is three orders of magnitude longer than that for a NI REBCO double-pancake coil. In a NI layer-wound coil, the circumferential current firstly flows along the periphery of the coil winding, and then it diffuses from the top and bottom turns into the middle turns of the winding, resulting in a long characteristic magnetic field delay time due to the current diffusion process. In contrast, the characteristic magnetic field delay time for a NI double-pancake coil is dominated by the circumferential current decay in individual turns. On the basis of a derived scaling law, the characteristic magnetic field delay time for a NI REBCO layer-wound coil for a 400 MHz LTS/REBCO nuclear magnetic resonance (NMR) magnet is 37 h, while that for a NI REBCO double-pancake coil is only <1 min. Thus, it is demonstrated that a double-pancake-winding is greatly preferred to a layer-winding for NMR applications from the view point of the characteristic magnetic field delay time.