A volume of an additively manufactured 316L stainless steel sample has been tracked during its recrystallization using near- and far-field High Energy Diffraction Microscopy (HEDM) and absorption tomography at Advanced Photon Source beamline 1-ID. A near-field compatible in situ furnace allows monitoring of Bragg diffraction signals as they evolve out of a weak and diffuse background while the sample temperature is ≈ 1250° C. The sample is rapidly cooled to room temperature after observation of significant signal evolution and ∼ 0.035 mm3 is mapped by the near-field method. Four cycles of heat treatment follow the structure from a state of small, isolated grains through impingement of domains to near completion of recyrstallization. Here, the experiment and reconstructions are described, and recrystallized fractions, twin domains, and distributions of grain boundary types are discussed.

The recent commissioning of a movable monochromator at the 34-ID-C endstation of the Advanced Photon Source has vastly simplified the collection of Bragg coherent diffraction imaging (BCDI) data from multiple Bragg peaks of sub-micrometre scale samples. Laue patterns arising from the scattering of a polychromatic beam by arbitrarily oriented nanocrystals permit their crystal orientations to be computed, which are then used for locating and collecting several non-co-linear Bragg reflections. The volumetric six-component strain tensor is then constructed by combining the projected displacement fields that are imaged using each of the measured reflections via iterative phase retrieval algorithms. Complications arise when the sample is heterogeneous in composition and/or when multiple grains of a given lattice structure are simultaneously illuminated by the polychromatic beam. Here, a workflow is established for orienting and mapping nanocrystals on a substrate of a different material using scanning Laue diffraction microscopy. The capabilities of the developed algorithms and procedures with both synthetic and experimental data are demonstrated. The robustness is verified by comparing experimental texture maps obtained with Laue diffraction microscopy at the beamline with maps obtained from electron back-scattering diffraction measurements on the same patch of gold nanocrystals. Such tools provide reliable indexing for both isolated and densely distributed nanocrystals, which are challenging to image in three dimensions with other techniques.