No abstract

Abstract-Accelerated test is commonly used to obtain reliability data of products by exerting loads over usage conditions for highly reliable and long life products, and it's very significant to decide the acceleration factor (AF) in the test. For electronic equipment, the AF obtained by traditional method can only consider the internal failures caused by the components, without covering the interconnection failures caused by solder joints, pin failures, etc. Thus, a new method based on failure physics is presented in this study to determine the synthetical AF taking both internal failures and interconnection failures into consideration. The AF of the internal failures caused by the components is calculated based on the Arrhenius model, and the AF of the interconnection failures caused by solder joints is captured by reliability simulation test with a software called Calce PWA. Then, the synthetical AF of the electronic equipment can be determined by weighted fusion of both two AFs. Finally, the feasibility and validity of the proposed method can be verified by an application of an embedded electronic device.