Laser induced autofluorescence spectroscopy of enamel and teeth at different artificial demineralization stage irradiated by 403 nm semiconductor laser were investigated. The quantitative evaluation parameter of mineral content is built on the basis of the fluorescence characteristic spectrum of 443 nm and 526 nm ratio to the total fluorescence integral. In the end, the dependence of characteristic spectrum on the excitation light power was experimentally investigated. The results reveal that at least 10 mW power is necessary to stimulate the featured spectrum.

Release control plays an important role on the performance of a semiconductor wafer fabrication facility. Comparing to common release control strategies (such as FIFO, EDD, SA, CONWIP, WR, and WIPCTRL), a new workload regulating policy (abbreviated as WRELM), with a dynamic critical value on the bottleneck obtained by an extreme learning machine, is proposed. WRELM is validated and verified by a simulation model from a real 6 inch fab. The simulation resultsshow that WRELM improves the throughput by 4.02% and decrease the mean cycle time by 15.40% comparing to those of common WR.