The N beam position monitor method (N-BPM) which was recently developed for the LHC has significantly improved the precision of optics measurements that are based on BPM turn-by-turn data. The main improvement is due to the consideration of correlations for statistical and systematic error sources, as well as increasing the amount of BPM combinations which are used to derive the β-function at one location. We present how this technique can be applied at light sources like ALBA, and compare the results with other methods.
Standard quadrupole beam-based alignment (BBA) techniques rely on orbit data and on the sequential variation of quadrupole and orbit corrector magnets (OCM). This results in time-consuming measurements of the order of several hours in most circular accelerators. Fast (10 kHz) beam position monitors (BPM) and OCMs with ac power supplies are routinely used in modern synchrotron light sources to drive fast orbit feedback systems. In this paper we show how they can be employed also to dramatically reduce the time for any quadrupole BBA to several minutes only, ensuring the same level of accuracy and precision. Moreover, conversely to the standard BBA, the new procedure accounts automatically for any level of betatron coupling, BPM roll and OCM tilt. In the case of the ALBA 3rd generation light source, the time for a complete measurement dropped from 5 hours to 10 minutes, a reduction by a factor 30. As further extension of this novel approach, an even faster skew quadrupole BBA was demonstrated in ALBA for the first time, taking advantage of the additional ac modulation of the skew quadrupole field. Results from this fully ac measurement are compared with those obtained via a traditional dc scan of the skew quadrupole.
Transverse beam coupling impedance is a source of beam instabilities that limits the machine performance in circular accelerators. Several beam based techniques have been used to measure the transverse impedance of an accelerator, usually based on the optics distortion produced by the impedance source itself. Beam position monitor turn-by-turn analysis for impedance characterization has been usually employed in large circumference machines, while synchrotron light sources have mainly used slow orbit based techniques. Instead, the work presented in this paper uses for the first time turn-by-turn data at ALBA to advance the measurement technique into the range of the typically small impedance values of modern light sources. We have measured local impedance contributions through the observation of phase advance versus bunch charge using the betatron oscillations excited with a fast dipole kicker. The ALBA beam position monitor system and the precision of the turn-by-turn analysis allowed to characterize the main sources of transverse impedance, in good agreement with the model values, including the impedance of an in-vacuum undulator.
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