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We show how the intensity enhancement of angle-resolved x-ray photoelectrons along the emitterscatterer internuclear directions can be used to monitor layer-by-layer growth of Co on Cu(lll). Specifically, we show how the technique can distinguish between fee or hep growth and determine precisely the thickness at which the fee stacking switches to hep. We also show how the interference patterns around each forward-focusing direction can be used to produce real-space images of nearestneighbor atoms in the atomic plane above the emitting atom.