Memristors show great potential for being integrated into CMOS technology and provide new approaches for designing computing-in-memory (CIM) systems, brain-inspired applications, trimming circuits and other topologies for the beyond-CMOS era. A crucial characteristic of the memristor is multi-state 1 switching. Memristors are capable of representing information in an ultra-compact fashion, by storing multiple bits per device. However, certain challenges remain in multistate memristive circuits and systems design such as device stability and peripheral circuit complexity. In this paper, we review the state of the art of multi-state memristor technologies and their associated CMOS/Memristor circuit design, and discuss the challenges regarding device imperfection factors, modelling, peripheral circuit design and layout. We present measurement results of our in-house fabricated multi-state memristor as an example to further illustrate the feasibility of applying multistate memristors in CMOS design, and demonstrate their related future applications such as multi-state memristive memories in machine learning, memristive neuromorphic applications, trimming and tuning circuits, etc. In the end, we summarize past and present efforts done in this field and envisage the direction of multi-state memristor related research.

No abstract

This paper proposes a memristor-assisted sign-based background calibration scheme for analog-to-digital converters (ADCs). The scheme was implemented and validated in a 12bit asynchronous successive approximation register (SAR) ADC, which consists of a hybrid binary weighted/R-2R digital-to-analog converter (binary/R-2R DAC) and other peripheral circuits. This hybrid DAC, in which one redundancy bit is introduced, is built with a memristor and standard polysilicon resistors. The proposed calibration technique can detect the errors caused by DAC mismatches and correct them by adjusting the resistance of the memristor (memristance 1 ) in a feedback loop. The implemented circuit takes the memristor's advantages such as small area and resistance switching property. The proposed scheme has been designed and simulated in a standard 180 nm CMOS process. Eventually, a monolithic CMOS/memristor chip will be fabricated with the CMOS part processed at a standard foundry and the memristors integrated through post-CMOS processing in house. Simulation results demonstrate the feasibility of exploiting memristors to improve the linearity of high-resolution SAR ADCs. The designed calibration scheme can effectively reduce the integral non-linearity (INL) and differential non-linearity (DNL) of the 12-bit SAR ADC.

No abstract