With the development of display technology, several new displays have attracted much attention such as OLED display, QLED display, Laser display and Mini/MicroLED display. Displays with high brightness, wide color gamut, high efficiency and long lifetime are our ultimate goal. Defect inspections and color measurements are important for us to evaluate display quality. To obtain wide color gamut, we usually use narrow spectral bandwidth light source. However, it's not easy for traditional color camera or filter camera to measure narrow bandwidth light source because the accuracy is limited. In this paper, we simulate color measurement accuracy by color camera and filter camera. We analyze the influence of bandwidth effect on the color measurement and carry out bandwidth effect correction method. With the correction, the measurement accuracy improves obviously. In addition, different displays with different spectral bandwidth have been measured to validate the corrections. The results show significant improvement in color measurement accuracy. Our bandwidth effect correction can be used for wide color gamut display measurement.

With the development of MicroLED technology, MicroLED displays show attractive potential because of high brightness, high efficiency, low energy consumption and long lifetime. However, it's difficult to deal with MicroLED displays' defect inspection and color measurement because MicroLED displays usually contain millions of pixels which emit light separately. In this paper, pixel‐level color measurement based on imaging spectrometer is introduced which can be used for MicroLED inspection. The imaging spectrometer offers high color measurement accuracy under different conditions including luminance, spectral shape, bandwidth. Compared with colorimeter based on color camera, the imaging spectrometer offers better accuracy and robustness.