Представлений і описаний створений відповідно до вимог міжнародного стандарту IEC 62305-1-2010 потужний високо-вольтний генератор, що формує на низькоомному активно-індуктивному навантаженні аперіодичні імпульси струму штучної блискавки нормованої тимчасової форми 10 мкс/350 мкс і амплітуди ±(100−200) кА із заданими вищезгаданим стандартом допусками. Приведені результати практичної апробації у лабораторних умовах даного генератора при вико-ристовуваному електричному навантаженні з активним опором 0,1 Ом і індуктивністю 1,5 мкГн. Бібл. 14, рис. 8. Ключові слова: генератор аперіодичних імпульсів струму штучної блискавки, потужне джерело енергії, низькоомне електричне навантаження.Представлен и описан созданный в соответствии с требованиями международного стандарта IEC 62305-1-2010 мощный высоковольтный генератор, формирующий на низкоомной активно-индуктивной нагрузке апериодические импульсы тока искусственной молнии нормированной временной формы 10 мкс/350 мкс и амплитуды ±(100−200) кА с заданными вышеуказанным стандартом допусками. Приведены результаты практической апробации в лаборатор-ных условиях данного генератора при используемой электрической нагрузке с активным сопротивлением 0,1 Ом и индуктивностью 1,5 мкГн. Библ. 14, рис. 8. Ключевые слова: генератор апериодических импульсов тока искусственной молнии, мощный источник энергии, низ-коомная электрическая нагрузка.
The subject matter is the mechanisms of emergence of instabilities in natural oscillations of semiconductor supertattices caused by their interaction with charged particle flows of extraneous electromagnetic radiation. The aim is calculating ratios to determine a degree of deviation of operating characteristics of semiconductor components from the norm, depending on the parameters of extraneous pulsed electromagnetic radiation. The objective is to model how currents that are induced with extraneous EMR interact with electrostatic oscillations of a semiconductor supertattice, using an implementation of (Cherenkov) resonance interaction of moving charges with electromagnetic oscillations under conditions where the phase velocity of the wave and the velocity of the charged particle are the same. The methods used: analytical methods for solving Maxwell's equations and medium equations in a framework of hydrodynamic approach. The following results are obtained. We have studied semiconductor components of electronic equipment (supertattices) being exposed to strong pulsed electromagnetic fields. The study was focused on the nature of changes in the working capacity of the components. We show that the effect of pulsed electromagnetic radiation is accompanied by an emergence of currents in the conductive hardware elements and an emergence of internal fields within them. One kind of reversible failures of semiconductor hardware elements is determined, based on interaction of extraneous radiation induced currents with the intrinsic fields of the supertattices of the hardware components. Similar failures occur under conditions of Cerenkov radiation (when the current is parallel to the structure boundary). It is shown that such interaction leads to energy losses in the induced currents spent to excitation of natural oscillations of the supertattice, i.e. to emergence of an oscillation generation mode that is characterized with a change in the volt-ampere characteristics of the hardware. Conclusion. The results obtained in this work can be used to evaluate the efficiency of active radio electronic devices (amplifiers, generators and converters of electromagnetic oscillations in the millimeter and sub-millimeter ranges) being exposed to extraneous pulsed electromagnetic fields. The comparative analysis of quantitative evaluations of reversible failures of semiconductor devices in dependence on the spatial configuration of the acting field (induced current parallel to the structure boundary) allows solving problems in optimizing the degree of distortion of the performance characteristics of these devices.
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