A new experimental method for nanoscale measurements of the absorption spectra of single nanoobjects has been developed based on scanning near-field optical microspectroscopy (SNOM) and nanospectrophotometry (NSP). The main distinctive feature of the proposed SNOM-NSP technique consists in depositing a sample onto a coverglass followed by its probing in the total internal reflection spectroscopy mode. This approach allows the number of analyzed samples to be significantly increased and provides the possibility of combining measurements with other optical techniques. The proposed SNOM-NSP method has been successfully used for studying single plasmonic nanoparticles and their complexes with Rhodamine 6G dye.
A united analytical technology based on the integration of scanning probe nanotomography and optical microscopy (SPNT-OM) is presented and the potential of the technology is demonstrated by the example of multi-parameter analysis of encoded microspheres. The presented SPNT-OM technology can become a powerful tool for multimodal nanocharacterization of a wide range of microparticles, composite and hybrid polymers.
Competitive schemes for constructing an optical system for combining a scanning probe microscope and optical microspectrometer, allowing the study of opaque samples by the method of tip enhancement of the Raman scattering intensity, are considered. Optimal objectives for the implementation of each scheme, taking into account the presence of a scanning microscope probe, are selected. The efficiency of usage of each optical scheme is estimated quantitatively for both excitation of a Raman scattering signal and collecting secondary radiation. As a result, the most effective optical system in terms of "excitation / collection“ parameter is revealed.
A system of a low-profile SPM-deflectometer (SPM - scanning probe microscopy) which makes it possible to increase the aperture of the supplied objectives to the currently record value NA = 0.75 has been developed, manufactured and tested. The introduction of such a system will significantly improve the performance of optical techniques for combined SPM / optical microspectroscopy systems.
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