No abstract

For the first time, a passive method for radiosensor diagnostics of the integrity of signals from microprocessor devices was developed and presented. The method is based on the registration of the electrical component of the near field of electromagnetic radiation induced as a result of the clock formation (variability) of the impulse response of a digital circuit caused by the dynamic restructuring of the active configuration of its in-circuit and peripheral architecture. It is shown that real radiation is a superposition of fields of emitters of the active architecture of a microprocessor, each of which has its own impulse and amplitude-frequency characteristics with its own peaks and dips, resonances and excitations. An expression of the free component is presented for the oscillatory nature of the process of energy redistribution between reactive storage devices, which depends on the capacitances of the gate dielectrics of MIS transistors, barrier and diffusion capacities of p-n junctions, inductances and ohmic resistances of circuit elements and the scheme of their architectural connection. An experiment was prepared and carried out on the method of passive radio-wave technical diagnostics of microprocessor devices on a specially developed test sample with a known command execution algorithm. The results of registration of a series of signal radio profiles when starting a sample of a digital device are presented, and a correlation assessment of the reproducibility of the experiment is carried out. It is proved that time interval transitions of free oscillations are formed on the reference signal radio profile. These transitions correspond to the microcontroller’s reference to the periphery according to the algorithm of the command functioning of the sample. The possibility of obtaining detailed information about the nature of the peripheral load and its performance by examining the corresponding sections of the reference signal radio profile is shown. It was found that the spectral-time frames of the software and hardware functioning of the digital device under study are clearly identified on the recorded radio images.

Abstract. Stroboscopic reception eliminates the possibility to process non-stationary ultrashort pulses, since a series of absolutely identical pulses is needed to correctly restore the original time profile. Reconstruction of the non-stationary ultrashort pulse signal from one pulse will solve the concealment problems in the systems of the radio

Introduction. Technical diagnostics (TD) as a nascent discipline is rapidly developing in the field of both software and hardware. Modern TD methods, such as vibrometry, thermal control, JTAG testing and optical control, either exhibit high inertia, consume processor time, require suspension of the electronic device, or demand a galvanic contact with the study object, which is often unacceptable. These disadvantages can be eliminated by passive radio-sensor TD. To date, little information has been published on the parameters of electronic devices provided by this method.Aim. Determination of the parameters of electronic devices, the assessment of which can be provided by passive radio-sensor TD.Materials and methods. Signal radio profiles were obtained experimentally using metrological equipment and software-numerical methods for modeling radio wave processes. The parameters of the signal radio profile were calculated by a mathematical method for solving differential equations.Results. The main principles and results of radio-sensor TD, as well as the simplest toolkit, are shown. An equation is obtained for the signal radio profile emitted by the electronic unit of the device, as well as an expression for its free components. An approach for assessing the TD correctness based on the number of free components of the received signal radio profile and the reference is described. The possibility of obtaining information about temperature, voltage drop, speed of emitting nodes, as well as the state of its components and modes of operation of p–njunctions is demonstrated. It is shown that this information is carried by the parameters of the basic equation for the signal radio profile.Conclusion. The derived basic equation allows a non-contact, remote passive radio-sensor TD to be conducted by correlation analysis of the received signal, providing a detailed examination of malfunctions in each electronic unit. The described TD method based on the presented parameters is promising for assessing the technical state of electronic devices.

For the first time, a simplified model of the redistribution of vibrational energy in a MOS transistor has been developed and analyzed. The transistor is turned on in open drain mode and in inverter mode. After calculating the parameters, the numerical radio profiles of the signals of the electrical component of electromagnetic radiation, created by the key unit itself, were obtained. An experiment was carried out to register the vibrational redistribution of energy in a MOS transistor using a specially designed sample. The results of registration of a series of radio profiles of signals with the configuration of the universal ports of the sample of a digital device are presented, and a correlation assessment of the reproducibility of the experiment is carried out. The correlation of the radio profiles of the signals obtained as a result of modeling and as a result of the experiment is not lower than 0.93. This testifies to the correctness of the developed models. On the basis of the presented development, a correlation assessment of the radiation of a reference sample and a sample with a slight deviation of parameters has been carried out. Even with a slight change in the parameters of the key node associated with degradation of the gate dielectric, the cross-correlation in the normal state and with a defect r < 0.7, which indicates a significant difference in the signal radio profile of normal functioning and with deterioration of parameters. The proposed models can be used in passive radio-wave technical diagnostics based on the registration of the electrical component of electromagnetic radiation generated by the radio-electronic devices themselves and opens up new possibilities for diagnosing malfunctions at the early stages of their occurrence.