The results of studying the influence of the thickness of La0.7Sr0.3MnO3 films obtained by magnetron sputtering on (110) NdGaO3 substrates on the magnetic and crystallographic properties using ferromagnetic resonance and X-ray spectroscopy are presented. The dependences of the uniaxial and cubic anisotropy fields on the sample thickness are established. Furthermore, it is shown that the magnetic and crystallographic properties of a film obtained by magnetron sputtering strongly depend on the target region from which it is made. The results obtained will be useful for interpreting the experimental data and creating a series of samples.

The temperature dependence of the voltage induced by the spin current was studied in an epitaxial thin-film La0.7Sr0.3MnO3 / SrIrO3 heterostructure deposited on a single-crystal NdGaO3 substrate. The spin current was generated by microwave pumping under conditions of ferromagnetic resonance in the La0.7Sr0.3MnO3 ferromagnetic layer and was detected in the SrIrO3 layer due to inverse spin Hall effect. A significant increase of half-width of the spin current spectrum along with the rise of amplitude of the spin current upon cooling from room temperature (300 K) to 135 K were observed.