1989
DOI: 10.1049/el:19890558
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100 GHz active electronic probe for on-wafer S-parameter measurements

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Cited by 10 publications
(2 citation statements)
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“…At this point, it became apparent that we had managed to develop a technology that had the characterization of mm-wave ICs from 75GHz to 110 GHz band with the low-frequency vector network analyzer ( Figure 12) [46]. A group from University of California, Santa Barbara (United States) applied nonlinear transmission lines for generating broadband stimulus, expanding the bandwidth of the active probe for 8 GHz to 96 GHz [47] and one year later for 7-120 GHz band with an impressive measurement repeatability of 0.2 dB [48].…”
Section: Micromachined On-wafer Probe Technologymentioning
confidence: 99%
“…At this point, it became apparent that we had managed to develop a technology that had the characterization of mm-wave ICs from 75GHz to 110 GHz band with the low-frequency vector network analyzer ( Figure 12) [46]. A group from University of California, Santa Barbara (United States) applied nonlinear transmission lines for generating broadband stimulus, expanding the bandwidth of the active probe for 8 GHz to 96 GHz [47] and one year later for 7-120 GHz band with an impressive measurement repeatability of 0.2 dB [48].…”
Section: Micromachined On-wafer Probe Technologymentioning
confidence: 99%
“…This is a potentially powerful capability, as it would allow integration of diode-based circuits such as multipliers, detectors, and mixers directly on the probe tip. For example, a 6port reflectometer [55] or even a frequency extender could be integrated onto the probe [56], both alleviating the high loss associated with long waveguide sections.…”
Section: Integration Of Sensors and Devicesmentioning
confidence: 99%