2005
DOI: 10.1117/12.601740
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13.5 nm emission from composite targets containing tin

Abstract: The aim of this study is to investigate ways to maximise the efficiency of tin based laser produced plasmas as sources of EUV radiation in the 2% band centered on 13.5 nm. It has been found that targets containing below 15% tin atoms by number emit more brightly in the spectral region around 13.5 nm than pure tin targets. Furthermore, if the remaining material in the target is composed on primarily low-Z atoms, then both plasma continuum radiation and Bremsstrahlung radiation are greatly reduced. In addition, … Show more

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Cited by 12 publications
(7 citation statements)
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“…They found 5 % target showed the highest efficiency higher than a Sn plate [23]. Our present result agrees with their report.…”
Section: Dependence Of Euv Intensity As a Function Of Concentrationsupporting
confidence: 95%
“…They found 5 % target showed the highest efficiency higher than a Sn plate [23]. Our present result agrees with their report.…”
Section: Dependence Of Euv Intensity As a Function Of Concentrationsupporting
confidence: 95%
“…Numerically, it has been shown that there is no significant change in the tin ion distribution when the target concentration of tin was reduced from 100% to 1% . Also, studies carried out by Hayden et al and Harilal et al suggest that dilute tin targets (15% and 0.5%) radiate more brightly in the EUV region at ~13.5 nm than dense (bulk) tin targets. Thus, efforts are currently being made to maximize the efficiency of EUV emission from tin‐doped targets, along with minimization of the tin concentration in the target matrix.…”
Section: Introductionmentioning
confidence: 99%
“…[12,13] To obtain a higher CE, researchers have come up with new ideas for the Sn target. Hayden et al [14] used ceramic slab targets doped with 5% and 6% Sn and an Nd:YAG laser for the EUV source. The results showed that the 5% (i.e., low density) Sn doped ceramic target had a maximum EUV CE of over 2.5% at the laser pulse intensity of 1.91 ×10 11 W•cm −2 , but the EUV CE of the Sn doped target was not always higher than that of pure Sn, because the EUV CE also varied with the laser power density.…”
Section: Introductionmentioning
confidence: 99%