2018
DOI: 10.1364/oe.26.018302
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13 μm InAs/GaAs quantum dot DFB laser integrated on a Si waveguide circuit by means of adhesive die-to-wafer bonding

Abstract: In this paper we report a single mode InAs/GaAs quantum dot distributed feedback laser at 1.3 μm wavelength heterogeneously integrated on a Si photonics waveguide circuit. Single mode lasing around 1300 nm with a side-mode suppression ratio higher than 40 dB is demonstrated. High temperature operation with continuous wave lasing up to 100°C is obtained. Threshold current densities as low as 205 A/cm were measured. These devices are attractive candidates to use in uncooled silicon photonic transceivers in data … Show more

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Cited by 38 publications
(21 citation statements)
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“…While Ge-photodiodes have been successfully integrated in a SOI platform [33,76,77,78], the integration of laser sources is still challenging [79]. Current approaches employ wafer-to-wafer [35,80] or die-to-wafer [31,81,82] bonding.…”
Section: System Integrationmentioning
confidence: 99%
“…While Ge-photodiodes have been successfully integrated in a SOI platform [33,76,77,78], the integration of laser sources is still challenging [79]. Current approaches employ wafer-to-wafer [35,80] or die-to-wafer [31,81,82] bonding.…”
Section: System Integrationmentioning
confidence: 99%
“…[3] Regarding this, native III-V devices have been integrated with Si photonic chips through co-packaging and heterogeneous integration. [4][5][6][7] Since the demonstration of the first prototype of a heterogeneously integrated DFB laser on Si, [7] it has only taken ~10 years to commercialize a 100 Gb/s integrated Si photonic four-channel course wavelength division multiplexed (CWDM) transmitter, and the industry expects to ramp up to 400 Gb/s in the next two years and then to double or quadruple that rate in just two more years. [8] Meanwhile, monolithic integration of III-V lasers on Si by epitaxial growth offers an elegant and lower cost path to integrate laser sources in a Si photonics platform.…”
Section: Introductionmentioning
confidence: 99%
“…En este caso el contacto de tira del chip tiene un ancho (d) de 0.01 cm y un largo (L) de 0.05 cm, lo cual corresponde a unárea de 0.0005 cm 2 . La densidad corriente de umbral es muy alta comparada con la literatura contemporánea [17], esto se debe esencialmente a la calidad de los contactosóhmicos.…”
Section: Resultados Experimentalesunclassified