2012
DOI: 10.1002/j.2168-0159.2012.tb05757.x
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18.3: 3‐D Metrology System based on a Bi‐directional OLED Microdisplay

Abstract: Bi-directional OLED based microdisplays offer interesting possibilities for new applications. Light emission and detection is included in one chip by using OLED-on-CMOS-technology. Such device has been primary made for optocouplers or photoelectric barriers, but it offers interesting possibilities for other application fields, e.g. multimedia and metrology. A new optical concept of a 3-D metrology sensor based on bi-directional OLED microdisplay will be presented.

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Cited by 1 publication
(2 citation statements)
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“…Due to the BiMiD crosstalk the projection (OLED microdisplay) and detection (photo diode matrix) field has to be separated. In Grossmann et al 13 a paraxial lens design and system simulation (fringe projection and recalculation of the 3-D object) based on the classical system setup applying the BiMiD is presented. Based on this system simulations, display characterization (see chapter 2) and system application parameters adapted optical lens designs were simulated.…”
Section: -D Metrology Systemmentioning
confidence: 99%
See 1 more Smart Citation
“…Due to the BiMiD crosstalk the projection (OLED microdisplay) and detection (photo diode matrix) field has to be separated. In Grossmann et al 13 a paraxial lens design and system simulation (fringe projection and recalculation of the 3-D object) based on the classical system setup applying the BiMiD is presented. Based on this system simulations, display characterization (see chapter 2) and system application parameters adapted optical lens designs were simulated.…”
Section: -D Metrology Systemmentioning
confidence: 99%
“…The process operation of the 3D sensor is shown in. 13 The projector/camera system based on the detection of an scenario and the sequentiell imaging of the stored image onto an image screen (e.g. wall).…”
Section: Introductionmentioning
confidence: 99%