23.1: Invited Paper: Electrical and Mechanical Properties of MgO Protecting Layer

Abstract

This paper focuses on the secondary electron emission coefficient (γ) and the degradation dynamics of the MgO protecting layer. It is demonstrated that the γ could be improved by 50 % at the maximum using an ion implantation technique. We discuss that the γ improvement is not based on the same principle as reported in the thermally equilibrium compound. As for the degradation dynamic, we point out that the desorption of MgO clusters from the MgO surface is enhanced in the surface normal direction by applying a bias voltage to the substrate. From a computer simulation, it is confirmed for the first time that the desorption of MgO constituent, in other words, the surface degradation, is certainly occurring under the electric field condition.

Electronic structure and electrical conductivity of MgO protecting layer in plasma‐display panels: A tight‐binding quantum chemical study

“…Despite the above difficulty, a great deal of effort has been expended in the improvement of the SEE of MgO protecting material in terms of the effect of defects, impurities, and crystallinity on the MgO thin film. [2][3][4][5][6] However, from an experimental point of view, the analysis of the electronic structures of the protecting layer materials under the working conditions of a PDP is still extremely difficult. To develop improved MgO protecting materials, it is important to advance the understanding of the electronic structures of the MgO protecting materials, which seems to be difficult by performing only experimental methods.…”