25.2: Invited Paper: Implications of Super High Resolution to Array Testing

Abstract

In the later half of 2000, display manufacturers will begin mass producing displays with resolutions from 150 to 200 pixels/in. These displays will have a color sub-pixel pitch of from 42 to 56 mm. For array inspection and test equipment, reduced pixel feature sizes and increased pixel counts will present new challenges in the areas of resolution, test time, and test coverage. The implications of these challenges for functional electrical testing will be discussed, and tradeoffs between test coverage and test time will be presented.