25.8 A Near- Threshold-Voltage Network-on-Chip with a Metastability Error Detection and Correction Technique for Supporting a Quad-Voltage/Frequency-Domain Ultra-Low-Power System-on-a-Chip

Lin, Chuxiong; He, Wenqi; Sun, Yanan; Pei, Bingxi; Mao, Zhigang; Seok, Mingoo

doi:10.1109/isscc19947.2020.9063126

Cited by 4 publications

(1 citation statement)

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“…Compared with the traditional EDAC technology, the total area is reduced by 26%-33%, and the number of error detection registers is reduced by 2.9-4.3 times. The metastability condition detection and correction scheme of Shanghai Jiao Tong University [27] introduced a circuit based on double-sampling to detect whether the input data are too close to the clock edge of the receiver, which is defined as a metastable condition. The technique ameliorates energy efficiency and the data rate by 27.2% and 21.1%, respectively.…”

Section: Research Status Of Direct Monitoring Avfs Technologymentioning

confidence: 99%

Near-Threshold Wide-Voltage Design Review

Zhao

Yang

Chen

et al. 2023

Tsinghua Sci. Technol.

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This paper presents a comprehensive review of near-threshold wide-voltage designs on memory, resilient logic designs, low voltage Radio Frequency (RF) circuits, and timing analysis. With the prosperous development of wearable applications, low power consumption has become one of the primary challenges for IC designs. To improve the power efficiency, the prefer scheme is to operate at an ultra low voltage of Near Threshold Voltage (NTV). For the performance variation and degradation, a self-adaptive margin assignment technique is proposed in the low voltage. The proposed technique tracks the circuit states in real time and dynamically allocates voltage margins, reducing the minimum supply voltage and achieving higher energy efficiency. The self-adaptive margin assignment technique can be used in Static Random Access Memory (SRAM), digital circuits, and analog/RF circuits. Based on the self-adaptive margin assignment technique, the minimum voltage in the 40 nm CMOS process is reduced to 0.6 V or even lower, and the energy efficiency is increased by 3-4 times.

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Section: Research Status Of Direct Monitoring Avfs Technologymentioning

confidence: 99%