2009
DOI: 10.1002/pssc.200880791
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33 μm free standing thick film vertical structure LED made by laser lift‐off

Abstract: The 33 μm thick film vertical structure LEDs without any substrate were fabricated and their free standings were successfully realized by laser lift‐off and HVPE technology. Through the AFM analyses we know that the laser irradiation can causes big damage to the wafer. However, since the 33 μm thick film vertical structure LEDs without any substrate have longer distance between the laser irradiating plane and the quantum well than the the thin film (3‐4 μm) vertical structure LED on Cu or Si substrate, the 33 … Show more

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Cited by 4 publications
(5 citation statements)
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“…Recently, some researchers have reported that InGaN/GaN MQW LED had grown on about 30-µm-thick HVPE GaN template. [15,16] Both of them observed the improvements of crystal quality and luminous efficiency of the LEDs on thick GaN template. Sun et al also showed that the LLO process had less degraded effect on the LED on thick template than that on a conventional buffer layer.…”
Section: Introductionmentioning
confidence: 96%
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“…Recently, some researchers have reported that InGaN/GaN MQW LED had grown on about 30-µm-thick HVPE GaN template. [15,16] Both of them observed the improvements of crystal quality and luminous efficiency of the LEDs on thick GaN template. Sun et al also showed that the LLO process had less degraded effect on the LED on thick template than that on a conventional buffer layer.…”
Section: Introductionmentioning
confidence: 96%
“…In spite of the above advantages of a thick GaN template, there are not many works reported on the GaN-based LED on thick GaN template. [11,[14][15][16] The GaN template is a virtual substrate since the real substrate underneath is sapphire. Hence, we call the regrowth on the GaN template "quasi homoepitaxy".…”
Section: Introductionmentioning
confidence: 99%
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“…However, the fabrication procedure of V-LEDs was proved complicated. Inductively coupled plasma (ICP) is usually used twice for etching away the u-GaN, for electric current isolation and for defining the chip size [27]- [29]. In our recent work, a new method called auto-split LLO technique is proposed in which ICP etching is used once and the definition of chip size is completed simultaneously during the removal of the sapphire substrate by LLO [30].…”
Section: Introductionmentioning
confidence: 99%
“…Nowadays, as GaN-based LEDs are widely used and the demand for high-brightness LEDs increases, improving LED efficiency is the most important task for the development of GaN-based LED technologies [1][2][3][4]. However, due to the small critical angle, such as absorption of light within the device, the light extraction efficiency (LEE) of LEDs is still very low [5,6].…”
Section: Introductionmentioning
confidence: 99%