2009 IEEE International Electron Devices Meeting (IEDM) 2009
DOI: 10.1109/iedm.2009.5424426
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3D 65nm CMOS with 320°C microwave dopant activation

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Cited by 12 publications
(14 citation statements)
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“…It has been shown that under this treatment GeO volatilization and Ge 2+ defects are suppressed [84], indicating also that the two defects may be related, i.e., one may be the precursor of the other. High pressure oxidation followed by low temperature oxygen annealing results in good quality GeO 2 [90,91]. The same is true for GeO 2 obtained by thermal oxidation at 450 • C [78,79] combined with an Al 2 O 3 highk cap [78,92] and by ozone oxidation [79,92], yielding a low density of states D it ∼ 1 × 10 11 cm −2 V −1 (or below) and some of the best Ge p-and n-MOSFETs.…”
Section: Extrinsic Defects and Passivation Of The Germanium Surface Amentioning
confidence: 66%
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“…It has been shown that under this treatment GeO volatilization and Ge 2+ defects are suppressed [84], indicating also that the two defects may be related, i.e., one may be the precursor of the other. High pressure oxidation followed by low temperature oxygen annealing results in good quality GeO 2 [90,91]. The same is true for GeO 2 obtained by thermal oxidation at 450 • C [78,79] combined with an Al 2 O 3 highk cap [78,92] and by ozone oxidation [79,92], yielding a low density of states D it ∼ 1 × 10 11 cm −2 V −1 (or below) and some of the best Ge p-and n-MOSFETs.…”
Section: Extrinsic Defects and Passivation Of The Germanium Surface Amentioning
confidence: 66%
“…It was realized that it is essential to minimize or eliminate the defects in order to improve the quality of MOS devices. One way to do this is by high pressure oxidation using > 40 Atm of O 2 [84,90,91]. It has been shown that under this treatment GeO volatilization and Ge 2+ defects are suppressed [84], indicating also that the two defects may be related, i.e., one may be the precursor of the other.…”
Section: Extrinsic Defects and Passivation Of The Germanium Surface Amentioning
confidence: 99%
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“…Microwave annealing increases the molecular rotational and polarization energies of dopants for activation [6], [7]. Microwave annealing is performed at low temperature, which suppresses the diffusion of dopants.…”
Section: Introductionmentioning
confidence: 99%
“…Microwave heating has the potential to benefit growing high-quality polycrystalline silicon via amorphous silicon (a-Si) thin films with low annealing temperature and short processing time for the application of thin-film transistors and solar cells [1][2][3][4][5][6]. The study of microwave heating for the crystallization of a-Si thin film has therefore become very intensive recently.…”
Section: Introductionmentioning
confidence: 99%