2018 IEEE 68th Electronic Components and Technology Conference (ECTC) 2018
DOI: 10.1109/ectc.2018.00058
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3D Heterogeneous Integration with Multiple Stacking Fan-Out Package

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Cited by 30 publications
(5 citation statements)
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“…To meet these new needs, a paradigm shift in design architecture was required, which gave rise to the invention of 3D stacked devices. In comparison to current packaging solutions, hybrid bonding of chiplets will provide an order of magnitude higher B/W between chiplets at lower power and latency [5,6].…”
Section: D Packaging For Heterogeneous Integrationmentioning
confidence: 99%
“…To meet these new needs, a paradigm shift in design architecture was required, which gave rise to the invention of 3D stacked devices. In comparison to current packaging solutions, hybrid bonding of chiplets will provide an order of magnitude higher B/W between chiplets at lower power and latency [5,6].…”
Section: D Packaging For Heterogeneous Integrationmentioning
confidence: 99%
“…3.1.2 Thermal Crosstalk. In advanced heterogeneous packages, heat generation in each device can affect neighboring units [28,46,78,81,83,107]. In the 2.5D package platform, the logic device and HBMs are placed within 500 lm because of signal integrity/power integrity (SI/PI) performance.…”
Section: Thermal Management Challenges Due To Multichipmentioning
confidence: 99%
“…40. Figure 41 shows another example [145], where six layers of chips are vertically interconnected together without TSVs. FOWLP has been used to build the RDLs to fan-out the circuitries to the peripheral of the packages and the vertical interconnects are through the Cu-pillar and microbumps.…”
Section: Opportunities For Fan-out Wafer-level Packagingmentioning
confidence: 99%