2016
DOI: 10.1016/j.mee.2016.01.041
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3D photodetecting structure with adjustable sensitivity ratio in UV–VIS range

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Cited by 7 publications
(4 citation statements)
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“…The differences between on-state resistance values are probably connected with the slightly higher resistivity of the AZO layers on β-Ga 2 O 3 than resistivity of the ITO layers on β-Ga 2 O 3 , as the resistivity of ITO drops after annealing at high temperatures in an oxygen-containing atmosphere. [9,15] The on-off (for À10 V off-state voltage and þ4 V on-state voltage) current ratios were 2Â10 10 and 1Â10 11 for the AZO and ITO Schottky contacts, respectively. The leakage current at reverse bias was compared with the thermionic field emission (TFE) model taking into account the tunneling process at metal/semiconductor interface…”
Section: Resultsmentioning
confidence: 99%
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“…The differences between on-state resistance values are probably connected with the slightly higher resistivity of the AZO layers on β-Ga 2 O 3 than resistivity of the ITO layers on β-Ga 2 O 3 , as the resistivity of ITO drops after annealing at high temperatures in an oxygen-containing atmosphere. [9,15] The on-off (for À10 V off-state voltage and þ4 V on-state voltage) current ratios were 2Â10 10 and 1Â10 11 for the AZO and ITO Schottky contacts, respectively. The leakage current at reverse bias was compared with the thermionic field emission (TFE) model taking into account the tunneling process at metal/semiconductor interface…”
Section: Resultsmentioning
confidence: 99%
“…Average Schottky barrier heights and ideality factors are 0.99 and 1.05 eV and 0.95 and 1.03 eV for AZO and ITO Schottky contacts, respectively. The on-off current ratio is about 2Â10 10 and 1Â10 10 for AZO and ITO Schottky contact, respectively. Moreover, the on-state resistance is about 6-7 and 4-5 mΩ cm 2 for AZO and ITO Schottky contact, respectively, and is 20-35 times lower than for previously reported transparent β-Ga 2 O 3 Schottky diodes.…”
Section: Methodsmentioning
confidence: 96%
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“…Previously a similar technology with small devices with epitaxial [18] and implanted [19,20] junction was applied. The small implantation junctions of 4H-SiC were used to build a dual-band photodetector [21,22]. For sensing applications the term "large area" is defined to be larger than 1 mm 2 [23].…”
Section: Photodiode Fabrication and Characterizationmentioning
confidence: 99%