2020 IEEE International Solid- State Circuits Conference - (ISSCC) 2020
DOI: 10.1109/isscc19947.2020.9062924
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5.6 A 1/2.65in 44Mpixel CMOS Image Sensor with 0.7µm Pixels Fabricated in Advanced Full-Depth Deep-Trench Isolation Technology

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Cited by 27 publications
(19 citation statements)
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“…This technique primarily belongs to the field of computer vision, where mainly optical sensors such as an RGB camera and light detection and ranging (LiDAR) are employed [ 1 , 2 , 3 ]. Therefore, the optical sensors dominate the field, owing to the very high spatial resolution available in the range of μm [ 4 ] at the optical spectrum. However, the optical sensors are limited in terms of penetration depth and highly dependent on environmental conditions such as daylight and weather.…”
Section: Introductionmentioning
confidence: 99%
“…This technique primarily belongs to the field of computer vision, where mainly optical sensors such as an RGB camera and light detection and ranging (LiDAR) are employed [ 1 , 2 , 3 ]. Therefore, the optical sensors dominate the field, owing to the very high spatial resolution available in the range of μm [ 4 ] at the optical spectrum. However, the optical sensors are limited in terms of penetration depth and highly dependent on environmental conditions such as daylight and weather.…”
Section: Introductionmentioning
confidence: 99%
“…Active elements in modern integrated electronic circuits have reached sizes of only a few tens of nanometers [1], thanks to the short de Broglie wavelength of the conduction electrons. Optical elements, on the other hand, are limited by diffraction effects, leading to much larger device sizes typically beyond the scale of the photon wavelength [4,11]. Yet it is desirable to integrate electronic and photonic elements, since light is widely employed as signal carrier in modern telecommunication applications [20].…”
Section: Introductionmentioning
confidence: 99%
“…However, shrinking photodetectors below the diffraction limit is not easily possible without loss in efficiency. First of all, reducing the thickness of the detector leads to decreasing light absorption in its active material [11]. This especially applies for silicon, due to its indirect bandgap, but also to other materials, like few-layer transition-metal dichalcogenides, which are promising for modern photonic applications and narrow-band photodetectors, due to their comparatively strong absorption at their exciton transition energies [27,19].…”
Section: Introductionmentioning
confidence: 99%
“…Within the More than Moore context, 3D CMOS Image Sensors enable the possibility of smarter and more advanced sensors through the co-integration of different blocks (Analog, Digital, RF) in various tiers. Although 3D stacking technologies have been used for 3D CIS [1], [2], constraints of traditional 3D stacking alignment capabilities forbid the more aggressive pixel miniaturization required for future generations of CIS [3], [4]. This drawback can be overcome by using 3D sequential integration (3DSI -also named 3D monolithic integration or 3D VLSI), an emerging technology where the stacked tiers are fabricated sequentially on top of each other [5].…”
Section: Introductionmentioning
confidence: 99%