Abstract:This paper presents a process in which a 55V-class of power devices is added to baseline 0.25um 2.5V/5V/20V CMOS technology by forming asymmetric extended-drain device structures in which an inverted well design concept is utilized to form an extended-drain dielectric region. The R sp -BV ds figure-of-merit is consistent with best-in-class (0.65 mOhm cm 2 / 70V NMOS, 1.60 mOhm cm 2 / 70V PMOS), and the voltage handling is drift-length scalable from 20V to over 75V. Three classes of non-volatile memory are modu… Show more
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