1997
DOI: 10.1023/a:1018570509428
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Cited by 58 publications
(6 citation statements)
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“…(F) Multimode waveguide-PSP-coupling. To determine the thickness and the refractive index of the SAM independently from each other the recently published method of multimode waveguide-PSP-coupling was used. , An ion-exchanged buried multimode glass channel waveguide was coated with a 40 nm thick gold film to enable the coupling of the waveguide modes into the surface plasmon. Due to the resonant PSP coupling the dispersion of the effective refractive index of the waveguide mode and therefore the imaginary part of the effective refractive index is altered, which leads to a change in the transmitted light intensity of the waveguide modes.…”
Section: Methodsmentioning
confidence: 99%
“…(F) Multimode waveguide-PSP-coupling. To determine the thickness and the refractive index of the SAM independently from each other the recently published method of multimode waveguide-PSP-coupling was used. , An ion-exchanged buried multimode glass channel waveguide was coated with a 40 nm thick gold film to enable the coupling of the waveguide modes into the surface plasmon. Due to the resonant PSP coupling the dispersion of the effective refractive index of the waveguide mode and therefore the imaginary part of the effective refractive index is altered, which leads to a change in the transmitted light intensity of the waveguide modes.…”
Section: Methodsmentioning
confidence: 99%
“…If the structure of the sensor is composed only by cylindrical metal-dielectric components, such as optical waveguides (cores) and nanowires, for which there are good approximate analytical solutions, it is possible to expedite the calculation of the mode hybridization using simple numerical models [21,22]. Other methods, such as the expansion and propagation method [5] and the rigorous coupled wave analysis [9,23,24] can provide improved results to the mode hybridization. On the other hand, when considering devices composed of multiple layers of different materials, there are specific methods capable of addressing these problems, which include the method for multilayer structure transfer matrix modeling [6,25,26,27,28,29] and the optical fiber multilayer cylindrical structure [8].…”
Section: Simulation Modelsmentioning
confidence: 99%
“…Typically, the propagation of light in optical structures much larger than the wavelength can be described using ray-tracing models [3,4], whereas the performance of interferometric sensors or those based on overlapping of thin metal-dielectric films usually is calculated using simulations based on the propagation of plane waves, such as the expansion and propagation method (MEP) [5], the method for multilayer structure transfer matrix modeling [6,7], the optical fiber multilayer cylindrical structure [8], the rigorous coupled wave analysis (RCWA) [9] and sometimes wave-mode coupling [10,11]. However, when considering optical structures with sizes of the order or even below the wavelength, and with complex geometries, these methods fail short.…”
Section: Introductionmentioning
confidence: 99%
“…[25,26] Therefore, we use the mode expansion and propagation method to analyze the optical propagation of light in the deformed catenary aperture. [27,28] The output field of the deformed catenary aperture can be expressed as…”
Section: Mode Excitation and Propagation In Catenary Aperturementioning
confidence: 99%