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Vapor deposition and characterization of nanocrystalline nanolaminates

“…8 nm, the (110) superlattice peak splits [16] with additional α-Ta and V (110) components. The coherency strains which can create at smaller layer pair spacings are shown [30][31][32] arrows mark the location of the layer interfaces (as determined by atomic separations) and the diagonal arrows mark the presence of dislocation(s) within the Ni layer(s). The 15.7% lattice misfit that is created from the difference between the Au and Ni lattice parameters is accommodated differently in the ncnl(s) as the layer pair spacing is increased.…”

“…In the latter case, the superlattice distortions are shown to relax to unstrained values as the layer pair spacing increases. Typically, this is seen for fcc metallic ncnl systems as Au/Ni and Cu/Ni [30][31][32]35] as well as V/Ta [16] when the layer pair spacings exceed 6-9 nm as dependent upon the lattice misfit and deposition conditions. Characterization of the atomic positions and defect structure is accomplished using high-resolution electron microscopy [36][37][38] of ncnl(s) prepared and imaged in cross-section.…”

“…The purity of all elemental target materials is greater than 0.9994. The use of X-ray diffraction [9,11,12,[30][31][32][33] in the θ/2θ mode with monochromatic Cu K α radiation provides measure of the film texture, interplanar spacings, lattice distortions, layer pair spacing, composition profile, and grain size. In particular, the grain size (d g ) is determined from the broadening of the Bragg reflection corresponding to the textured film growth using the Debye-Scherrer formulation.…”

“…The analysis for position and intensity of the satellite peaks about the Bragg reflections at high angle provide quantification of lattice distortions periodic with the layer pair spacing. This analysis is accomplished [30][31][32] using both kinematical and dynamical X-ray theory to quantitatively distinguish the effects of an interfacial composition gradient, i.e. the composition profile, from superlattice distortions.…”

Interface Effects on the Mechanical Properties of Nanocrystalline Nanolaminates

“…The use of x-ray diffraction in the θ/2θ mode with monochromatic radiation provides a method [16][17][18][19][20][21] to measure the crystalline texture, interplanar spacings, lattice distortions, layer pair spacing, composition profile, and grain size of the ncnl. In particular, the grain size (h g ) can be assessed from the width of the Bragg reflection that corresponds to the textured growth.…”