2001 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.01 CH37184)
DOI: 10.1109/vlsit.2001.934969
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A 0.13 μm CMOS platform with Cu/low-k interconnects for system on chip applications

Abstract: We describe an advanced 0.13pm CMOS technology platform optimized for density, performance, low power and analoghixed signal applications. Up to 8 levels of Copper interconnect with industries first true low-k dielectric (SiLK, k=2.7) [ l ] result in superior interconnect performance at aggressive pitches. A 2.28pm2 SRAM cell is manufactured with high yield by introducing elongated local interconnects on the contact level without increasing process complexity. Trench based embedded DRAM is offered for large ar… Show more

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Cited by 39 publications
(12 citation statements)
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“…The circuit is realised in Infineon's 0.13 mm CMOS technology with six copper layers and a top aluminium level [6]. Only the analogue MIM capacitor option is used without additional RF-CMOS options such as a thick top metal or highresistivity substrate.…”
Section: Realisation and Measurementsmentioning
confidence: 99%
“…The circuit is realised in Infineon's 0.13 mm CMOS technology with six copper layers and a top aluminium level [6]. Only the analogue MIM capacitor option is used without additional RF-CMOS options such as a thick top metal or highresistivity substrate.…”
Section: Realisation and Measurementsmentioning
confidence: 99%
“…Furthermore, blocking capacitors have been added between VDD and GND to improve the power supply rejection . The circuit has been realized in Infineon's 0.13 urn technology described in [7]. The process offers 6 copper layers and 1.35 urn thick top aluminium layer.…”
Section: Circuit D Esignmentioning
confidence: 99%
“…The die area including the pads is only 0.47 mm by 0.49 mm. The chip is processed in INFINEON's standard 0.13 µm CMOS technology with 6 Cu layers and one Al pad top level [7]. Only the analog MIM capacitor option is used without additional RF-CMOS options such as thick top metal or high-resistivity substrate.…”
Section: Realization and Measurementsmentioning
confidence: 99%