2007 IEEE Symposium on VLSI Circuits 2007
DOI: 10.1109/vlsic.2007.4342685
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A 1.92¿s-wake-up time thick-gate-oxide power switch technique for ultra low-power single-chip mobile processors

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Cited by 12 publications
(4 citation statements)
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“…One well-known low-power circuit scheme is an on-chip power-isolation switch (OPS) scheme [2]. This scheme is very effective for reducing leakage when an LSI's function block is in the standby state.…”
Section: Introductionmentioning
confidence: 99%
“…One well-known low-power circuit scheme is an on-chip power-isolation switch (OPS) scheme [2]. This scheme is very effective for reducing leakage when an LSI's function block is in the standby state.…”
Section: Introductionmentioning
confidence: 99%
“…For instance, an implementation can include a power savings technique in which the FFT computing module can be operated in "sleep modes", where, the idle times are power gated to the computing module (i.e., the power supply is completely disconnected from the computing module). Guard times would then need to compensate for the wake-up time (i.e., the transition from a sleep mode to a computation mode) in addition to data load and read [74]- [77]. The resulting guard times will typically be on the order of microseconds, i.e., a small fraction of the typical OFDM symbol durations of 40 and 80 µsecs.…”
Section: Interleaving Timing Of Fft Computationsmentioning
confidence: 99%
“…The main reasons are 0 V initial voltage and feedback effect. However, the longer sensing delay, which is a few nanoseconds, is not a problem because it is much shorter than the wake-up time of the SoC, which generally takes from several hundred nanoseconds to several microseconds [24], [25]. The longer sensing delay may increase the probability of the read disturbance because the critical current decreases with the sensing delay.…”
Section: Sensing Delay Simulation and Area Estimationmentioning
confidence: 99%