SUMMARYThis paper presents a technique for mitigating two well-known DAC non-idealities in continuous-time delta-sigma modulators (CTDSMs), particularly in wide-band and low over-sampling-ratio (OSR) cases. This technique employs a special digital-to-analog convertor (DAC) waveform, called modified returnto-zero (MRZ), to reduce the time uncertainty effect because of the jittered clock at the sampling time instances and eliminate the effect of inter-symbol-interference (ISI) which degrades the modulator performance, especially when non-return-to-zero (NRZ) DAC waveform is chosen in the modulator design. A third-order single-bit CTDSM is designed based on the proposed technique and step-by-step design procedure at circuit and system levels, considering clock jitter and ISI, is explained. Circuit simulations in 180-nm CMOS technology show that in the presence of circuit non-idealities which generate jitter and asymmetrical rise and fall times in the DAC current pulse, signal-to-noise-distortion-ratio (SNDR) of the proposed modulator is higher than the conventional modulator with NRZ waveform by about 10 dB. In these simulations, clock jitter standard deviation is 0.3% of the sampling period (T S ) and the difference between fall/rise times in the DAC current pulse is 4%T S . Simulated at 600-MHz sampling frequency (f S ) with an oversampling ratio (OSR) of 24, SNDR figure of merit (FOM SNDR ) of the proposed modulator in 180-nm CMOS is 300 fj/conversion.